A Literature Review of IGBT Fault Diagnostic and Protection Methods for Power Inverters
By Bin Lu, Santosh K. Sharma. Annual Meeting of the IEEE Industry Applications Society, 2008
820 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/82b9cbdb6bec0756554bc060403b039cacaf31e4
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In Electrical and Electronic Engineering
- Frede Blaabjerg
- Huai Wang
- Marco Liserre
- U. Choi
- Kyo-Beum Lee
- Byeng Dong Youn
- Behrooz Mirafzal
- Jorge O. Estima
Citations in the corpus
- Physics-of-Failure, Condition Monitoring, and Prognostics of Insulated Gate Bipolar Transistor Modules: A Review (2015, methodology): “Lu and Sharma [13] presented existing methods for fault diagnostics and failure protection of IGBTs focusing on, in particular, three-phase power inverters.”
- Short-Circuit and Ground Fault Analyses and Location in VSC-Based DC Network Cables (2012, background): “4) VSC internal faults: In terms of fault-tolerant VSCs, the research aims are to protect the system from possible insulated-gate bipolar transistor (IGBT) faults (for example, short circuits), where there are many opportunities to allocate a backup function or include redundant devices [18]–[20].”
- Transitioning to Physics-of-Failure as a Reliability Driver in Power Electronics (2014, background): “As a consequence, five main types of faults can be identified: 1) single switch short-circuit (power semiconductor is desaturated working as current source or it is a physical short-circuit; 2) phase-leg short-circuit; 3) single switch opencircuit; 4) single-phase open-circuit; and 5) intermittent g”
- Survey of Fault-Tolerance Techniques for Three-Phase Voltage Source Inverters (2014, background): “The semiconductor switch failures can be classified into open-circuit faults, short-circuit faults, and intermittent gate misfiring faults [2].”
- A New Algorithm for Real-Time Multiple Open-Circuit Fault Diagnosis in Voltage-Fed PWM Motor Drives by the Reference Current Errors (2013, background): “Some reviews and surveys can also be found in the literature regarding fault diagnostic methods for VSIs single power switch open-circuit faults [9], [21]-[22].”
- Study and Handling Methods of Power IGBT Module Failures in Power Electronic Converter Systems (2015, methodology): “1) Desaturation Detection Method [44]–[46]: Fig.”