Reliability of power cycling for IGBT power semiconductor modules

By A. Morozumi, K. Yamada, T. Miyasaka, Y. Seki. Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248), 2001

272 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/89c0104426116b42f6ab24385a90dd4263677c1c

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Byeng Dong Youn
2. Bongtae Han
3. Changwoon Han
4. Hyunseok Oh
5. P. McCluskey

Citations in the corpus

• Physics-of-Failure, Condition Monitoring, and Prognostics of Insulated Gate Bipolar Transistor Modules: A Review (2015, background): “TABLE I COMPARISON BETWEEN WIRE-BOND AND PRESS-PACK MODULES [28], [30], [90], [91]”