J. Srour
Electrical and Electronic Engineering · 2000–2013
A researcher in the Science corpus: 3 papers; trusts 2 researchers and is trusted by 1 researcher here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 9 citations into it; #13,793 of 16,539 by trust here, #13,553 by citations
Whom J. Srour trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts J. Srour overall
Papers from J. Srour's perspective
Ordered by how strongly the researchers J. Srour trusts endorse each paper. Same corpus, a different order for every researcher.
- Radiation hard silicon detectors—developments by the RD48 (ROSE) collaboration
- Proton nonionizing energy loss (NIEL) for device applications
- Universal damage factor for radiation-induced dark current in silicon devices
- A Review of: “Electronic Structure: Basic Theory and Practical Methods”
- Review of displacement damage effects in silicon devices
- Modeling solar cell degradation in space: A comparison of the NRL displacement damage dose and the JPL equivalent fluence approaches †
- Threshold defect production in silicon determined by density functional theory molecular dynamics simulations
- Computer simulation of local order in condensed phases of silicon.
- Radiation-resistant solar cells for space use
- Simulation of non-ionising energy loss and defect formation in silicon
Their papers
- Universal damage factor for radiation-induced dark current in silicon devices (2000) — 167 citations
- Review of displacement damage effects in silicon devices (2003) — 699 citations
- Displacement Damage Effects in Irradiated Semiconductor Devices (2013) — 239 citations