Displacement Damage Effects in Irradiated Semiconductor Devices

By J. Srour, James W. Palko. IEEE Transactions on Nuclear Science, 2013

239 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/cff6209383d24f5c5b1160fb5d4a7e87392980bf

Citations in the corpus

• Displacement Damage in Silicon Detectors for High Energy Physics (2018, unknown): “Recent review articles and books with relevance for displacement damage in silicon devices for HEP applications have been published by Kramberger [6], Leroy and Rancoita [7], Srour and Palko [8], and Hartmann [9].”