Threshold defect production in silicon determined by density functional theory molecular dynamics simulations

By E. Holmström, A. Kuronen, Kai Nordlund. 2008

157 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/918271a8065305077f942be85f89152fffd8acd7

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In Electrical and Electronic Engineering

1. James W. Palko
2. J. Srour

Citations in the corpus

• Displacement Damage Effects in Irradiated Semiconductor Devices (2013, background): “with lattice direction [318], [319] and the recombination of defects [320], [321], as well as more complex structures, such as”