Universal damage factor for radiation-induced dark current in silicon devices

By J. Srour, D. Lo. 2000

167 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/bc4638b8f72104f0a0ae8f3ea45c51164e739be1

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In Electrical and Electronic Engineering

1. James W. Palko
2. J. Srour

Citations in the corpus

• Review of displacement damage effects in silicon devices (2003, background): “, see [174]), but it is nevertheless im-”
• Displacement Damage Effects in Irradiated Semiconductor Devices (2013, background): “) Experimental studies [124], [156] demonstrated that the rate”