Proton nonionizing energy loss (NIEL) for device applications

By I. Jun, M. Xapsos, S. Messenger, E. Burke, Robert Walters, G. Summers, T. Jordan. 2003

187 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/a179daa397633fd7b0310ae2f22ad268bb542a8d

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. J. Srour
2. James W. Palko

Citations in the corpus

• Review of displacement damage effects in silicon devices (2003, background): “, see [158] and references therein) or GEANT [159] and either directly calculate the nonionizing energy loss for PKAs or”