James W. Palko

Electrical and Electronic Engineering · 2013

A researcher in the Science corpus: 1 paper; trusts 2 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom James W. Palko trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. J. Srour

Papers from James W. Palko's perspective

Ordered by how strongly the researchers James W. Palko trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Universal damage factor for radiation-induced dark current in silicon devices
  2. A Review of: “Electronic Structure: Basic Theory and Practical Methods”
  3. Review of displacement damage effects in silicon devices
  4. Modeling solar cell degradation in space: A comparison of the NRL displacement damage dose and the JPL equivalent fluence approaches †
  5. Threshold defect production in silicon determined by density functional theory molecular dynamics simulations
  6. Computer simulation of local order in condensed phases of silicon.
  7. Radiation-resistant solar cells for space use
  8. Radiation hard silicon detectors—developments by the RD48 (ROSE) collaboration
  9. Proton nonionizing energy loss (NIEL) for device applications
  10. Simulation of non-ionising energy loss and defect formation in silicon

Their papers