Modeling solar cell degradation in space: A comparison of the NRL displacement damage dose and the JPL equivalent fluence approaches †

By S. Messenger, G. Summers, E. Burke, Robert Walters, M. Xapsos. 2001

275 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/8d4408ef6198e02583cab2160c079b1de4e83591

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In Electrical and Electronic Engineering

1. James W. Palko
2. J. Srour

Citations in the corpus

• Displacement Damage Effects in Irradiated Semiconductor Devices (2013, methodology): “This condition has allowed for a more straightforward analysis of displacement damage effects, often referred to as the NRL method [266], [268].”