Review of displacement damage effects in silicon devices

By J. Srour, C. Marshall, P. Marshall. 2003

699 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/5b09487f24981e4382d0ec5827994dcb2ac2a35f

How researchers see this paper

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In Electrical and Electronic Engineering

1. James W. Palko
2. J. Srour

Citations in the corpus

• Displacement Damage Effects in Irradiated Semiconductor Devices (2013, methodology): “For further details, the interested reader is referred to themany sources cited in Section II, such as [1] and references therein.”
• The CoRoT satellite in flight : description and performance (2009, background): “Along with transient events, proton impacts produce permanent hot pixels due mainly to atomic displacements in the silicon lattice (Srour et al. 2003; Hopkinson 1996).”