Thomas P. Moffat

Electrical and Electronic Engineering · 2000–2012

A researcher in the Science corpus: 6 papers; trusts 1 researcher and is trusted by 2 researchers here, as inferred from the citation graph.

Subfields

Whom Thomas P. Moffat trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Daniel Wheeler

Who trusts Thomas P. Moffat overall

  1. W. Dow
  2. Daniel Josell
  3. Daniel Wheeler

Papers from Thomas P. Moffat's perspective

Ordered by how strongly the researchers Thomas P. Moffat trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Phase-Field Models for Microstructure Evolution
  2. Phase field modeling of defects and deformation
  3. What is spinodal decomposition
  4. Phase-Field Simulation of Solidification
  5. Phase-field models in materials science
  6. Theory of Elasticity
  7. International Technology Roadmap for Semiconductors 2003の要求清浄度について － シリコンウエハ表面と雰囲気環境に要求される清浄度, 分析方法の現状について －
  8. Nonlinear Thermal Stress/Strain Analyses of Copper Filled TSV (Through Silicon Via) and Their Flip-Chip Microbumps (IEEE Transactions on Advanced Packaging)
  9. Failure mechanisms and optimum design for electroplated copper Through-Silicon Vias (TSV) (Electronic Components and Technology Conference)
  10. A study of thermo-mechanical stress and its impact on through-silicon vias

Their papers