Scott Roy

Electrical and Electronic Engineering · with Adamu-Lema · 2006

A researcher in the Science corpus: 1 paper; trusts 3 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom Scott Roy trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Asen Asenov

Papers from Scott Roy's perspective

Ordered by how strongly the researchers Scott Roy trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Intrinsic parameter fluctuations in decananometer MOSFETs introduced by gate line edge roughness
  2. Increase in the random dopant induced threshold fluctuations and lowering in sub-100 nm MOSFETs due to quantum effects: a 3-D density-gradient simulation study
  3. Intrinsic threshold voltage fluctuations in decanano MOSFETs due to local oxide thickness variations
  4. Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETs
  5. AND T
  6. RTS amplitudes in decananometer MOSFETs: 3-D simulation study
  7. Γ and B
  8. Temperature-Dependent Thermal Conductivity of Undoped Polycrystalline Silicon Layers
  9. Process Technology Variation (IEEE Transactions on Electron Devices)
  10. Fringing fields in sub-0.1 μm fully depleted SOI MOSFETs: optimization of the device architecture

Their papers