W. Huang

2006 IEEE International Symposium on Power Semiconductor Devices and IC's · with Chow · 2006

A researcher in the Science corpus: 1 paper; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.

Whom W. Huang trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. T. Paul Chow

Papers from W. Huang's perspective

Ordered by how strongly the researchers W. Huang trusts endorse each paper. Same corpus, a different order for every researcher.

  1. High-voltage normally off GaN MOSFETs on sapphire substrates (IEEE Transactions on Electron Devices)
  2. Pyroelectric properties of Al(In)GaN/GaN hetero- and quantum well structures
  3. High breakdown voltage AlGaN-GaN power-HEMT design and high current density switching behavior
  4. Time Dependence of Bias-Stress-Induced SiC MOSFET Threshold-Voltage Instability Measurements (IEEE Transactions on Electron Devices)
  5. Ultra-thin oxide reliability for ULSI applications
  6. N2O Processing Improves the 4H-SiC:SiO2 Interface
  7. Review on materials, microsensors, systems and devices for high-temperature and harsh-environment applications (IEEE transactions on industrial electronics (1982. Print))

Their papers