R. Chau
Electrical and Electronic Engineering · 2004–2006
A researcher in the Science corpus: 3 papers; trusts 3 researchers and is trusted by 16 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 8 citations into it; #1,601 of 16,539 by trust here, #5,630 by citations
- Biomedical Engineering — 5 citations into it; #999 of 10,734 by trust here, #5,593 by citations
Whom R. Chau trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts R. Chau overall
- Wei Dang Lu
- Y. Ouyang
- Claes Thelander
- Ping Xie
- John Robertson
- Youngki Yoon
- Charles M. Lieber
- L. Fröberg
- Jing Guo
- Siyu Koswatta
Papers from R. Chau's perspective
Ordered by how strongly the researchers R. Chau trusts endorse each paper. Same corpus, a different order for every researcher.
- Ultrathin high-K gate stacks for advanced CMOS devices (International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224))
- Effective electron mobility in Si inversion layers in metal–oxide–semiconductor systems with a high-κ insulator: The role of remote phonon scattering
- A logic nanotechnology featuring strained-silicon (IEEE Electron Device Letters)
- Doping and Electrical Transport in Silicon Nanowires
- AND T
- I and J
- Growth of nanowire superlattice structures for nanoscale photonics and electronics (Nature)
- Hydrothermal Synthesis and Characterization of Single-Molecular-Layer MoS2 and MoSe2
- MoS2 nanoparticles grown on graphene: an advanced catalyst for the hydrogen evolution reaction. (Journal of the American Chemical Society)
- Large-area graphene single crystals grown by low-pressure chemical vapor deposition of methane on copper. (Journal of the American Chemical Society)
Their papers
- Benchmarking nanotechnology for high-performance and low-power logic transistor applications (2004) — 671 citations
- High-/spl kappa//metal-gate stack and its MOSFET characteristics (2004) — 380 citations
- Tri-Gate Transistor Architecture with High-k Gate Dielectrics, Metal Gates and Strain Engineering (2006) — 231 citations