Doping and Electrical Transport in Silicon Nanowires
By Yi Cui, Xiangfeng Duan, A. Hu, Charles M. Lieber. 2000
890 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/e1f418c0585f2c4de05f52f8e9723d8d5e7cdb3a
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Atomic and Molecular Physics, and Optics
- Charles M. Lieber
- R. Chau
- Yu Huang
- Jianfang Wang
- Magnus Borgström
- J. Wallentin
- Yi Cui
- Xiangfeng Duan
In Biomedical Engineering
- Charles M. Lieber
- Magnus Borgström
- Yu Huang
- Xiangfeng Duan
- J. Wallentin
- G. Khan
- A. Basumallick
- J. Sarkar
In Electrical and Electronic Engineering
- Charles M. Lieber
- Magnus Borgström
- Xiangfeng Duan
- Yu Huang
- R. Chau
- J. Wallentin
- G. Khan
- A. Basumallick
Citations in the corpus
- Benchmarking nanotechnology for high-performance and low-power logic transistor applications (2004, positive): “10 illustrate the mechanism of ambipolar conduction.”
- Electronic properties of silicon nanowires (2005, background): “point of view, it has been shown that doped p type and n type SiNWS can be assembled to form p-n junctions, bipolar transistors, and complementary inverters [10], [25].”
- Indium phosphide nanowires as building blocks for nanoscale electronic and optoelectronic devices (2001, background): “To confirm the presence and type of dopants in the nanowires, we have performed gate-dependent, two-terminal transport measurements on individual wires, as the conductance will respond in an opposite way to changes in gate voltage ( V g ) for n-and p-type nanowires: V g > 0 will lead to an”
- Doping of semiconductor nanowires (2011, methodology): “In the linear transistor regime, the transconductance is connected to the mobility [20]: 𝑔𝑚 = 𝑑𝐼𝑆𝐷 𝑑𝑉𝐺 � 𝑉𝑆𝐷=𝑐𝑜𝑛𝑠𝑡𝑎𝑛𝑡 = 𝐶𝜇 𝐿2 𝑉𝑆𝐷 (6.2) Here, ISD is the source-drain current of the NW-FET, VSD and VG are the sourcedrain and gate voltages, respectively, and L is the length o”