Teng Xu

2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) · 2014

A researcher in the Science corpus: 1 paper; trusts 2 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Whom Teng Xu trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. M. A. Alam
  2. Souvik Mahapatra
  3. Ari Juels

Papers from Teng Xu's perspective

Ordered by how strongly the researchers Teng Xu trusts endorse each paper. Same corpus, a different order for every researcher.

  1. A comprehensive model of PMOS NBTI degradation (Microelectronics and reliability)
  2. RFID security and privacy: a research survey (IEEE Journal on Selected Areas in Communications)
  3. Physical One-Way Functions (Science)
  4. The internet of things: a survey (Information Systems Frontiers)
  5. Material dependence of hydrogen diffusion: implications for NBTI degradation (IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.)
  6. A two-stage model for negative bias temperature instability (IEEE International Reliability Physics Symposium)
  7. AC NBTI studied in the 1 Hz -- 2 GHz range on dedicated on-chip CMOS circuits (International Electron Devices Meeting)
  8. Analytic modeling of the bias temperature instability using capture/emission time maps (International Electron Devices Meeting)
  9. Two independent components modeling for Negative Bias Temperature Instability (IEEE International Reliability Physics Symposium)
  10. Disorder-controlled-kinetics model for negative bias temperature instability and its experimental verification (2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.)

Their papers