IC identification circuit using device mismatch

By K. Lofstrom, W. R. Daasch, Donald Taylor, Keith Lofstrom Siidtech, Robert Daasch. 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056), 2000

325 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/ae4b71c1bf957fc1974cc1e2a275c3153f8207f9

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In Electrical and Electronic Engineering

Citations in the corpus

Active Hardware Metering for Intellectual Property Protection and Security (2007, methodology): “Loftstrom et al. proposed a method for mismatchingthe devicesbased on changingthe threshold of the circuits by placing the impurity of random dopant atoms [ 20 ].”
A Systematic Method to Evaluate and Compare the Performance of Physical Unclonable Functions (2011, methodology): “One of the seminal works in the area of PUF is that of Lofstrom et al. in 2000 exploiting mismatch in silicon devices for identification of ICs [12].”
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain (2014, unknown): “[65] K.”
EPIC: Ending Piracy of Integrated Circuits (2008, background): “Until recently, only passive IC protection was available, based on unique chip IDs or programmable parts [9, 11 , 17, 18].”
A PUF taxonomy (2019, methodology): “1 Threshold Voltage (TV PUF): A Threshold Voltage PUF, TV PUF or Integrated Circuit IDentification (ICID) [28] typically examines the variation in threshold voltage of integrated transistors based on the variations of these transistors at the point of production.”
Preventing IC Piracy Using Reconfigurable Logic Barriers (2010, background): “Another early work in the passive-metering space explores using control-flow reconfigurability (through a programmable part) to support many equivalent variable mappings to registers.(6) Each such mapping serves as the individual signature for a chip’s authentication.”
Controlled physical random functions (2002, methodology): “For example, [17] uses random fluctuations in drain currents to assign an identifier to ICs.”
Fault Analysis-Based Logic Encryption (2015, background): “Physical Unclonable functions are leveraged to produce such IDs [17]–[19].”
Physically Unclonable Functions (2012, methodology): “[87] were the first to propose an embedded technique called ICID which measures implicit process variations on integrated circuits and use them as unique identifier of the embedding silicon die.”
Physically Unclonable Functions: A Study on the State of the Art and Future Research Directions (2010, methodology): “To the best of our knowledge, the first technique to assign a unique identification to every single instance of a regular integrated circuit, without the need for special processing steps or after-fabrication programming, was proposed in [30] and was called ICID.”
Physical Unclonable Functions for Device Authentication and Secret Key Generation (2007, methodology): “This paper focuses on silicon PUFs which are very easy to integrate into ICs and processors unlike other typesofPUFs.”
A technique to build a secret key in integrated circuits for identification and authentication applications (2004, background): “Previous researches have proposed the addition of specific circuits that produce unique responses due to manufacturing variation of MOSFET drain currents such that ICs can be identified [6].”
Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers (2009, unknown): “An early example indirectly measures MOSFET threshold voltages for RFID identification [16].”
Aegis: A Single-Chip Secure Processor (2007, background): “Researchers have proposed the addition of specific circuits that exploit manufacturing variations to uniquely identify each IC [76].”