F. Hooge

IEEE Transactions on Electron Devices · 2008

A researcher in the Science corpus: 1 paper; trusts 0 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Papers from F. Hooge's perspective

Ordered by how strongly the researchers F. Hooge trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Noise modeling for RF CMOS circuit simulation
  2. End of Moore's law: thermal (noise) death of integration in micro and nano electronics
  3. Electrical noise and RTS fluctuations in advanced CMOS devices (Microelectronics and reliability)
  4. Critical discussion on unified 1/f noise models for MOSFETs
  5. A General Theory of Phase Noise in Electrical Oscillators
  6. RF-CMOS Performance Trends (European Solid-State Device Research Conference)
  7. A compact scattering model for the nanoscale double-gate MOSFET
  8. Analytical modeling of quantization and volume inversion in thin Si-film DG MOSFETs
  9. NROM: A novel localized trapping, 2-bit nonvolatile memory cell (IEEE Electron Device Letters)
  10. A review of the pseudo-MOS transistor in SOI wafers: operation, parameter extraction, and applications

Their papers