A review of the pseudo-MOS transistor in SOI wafers: operation, parameter extraction, and applications

By S. Cristoloveanu, D. Munteanu, M. Liu. 2000

185 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/fcfd658ceb3a97efc4b7219b03646a133c18bf2a

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. T. Ernst
2. G. Ghibaudo
3. T. Ouisse
4. S. Cristoloveanu
5. S. Horiguchi
6. Y. Ono
7. Yasuo Takahashi
8. K. Murase

Citations in the corpus

• Ultimately thin double-gate SOI MOSFETs (2003, background): “Small back-channel transconductance humps have been observed earlier and used to asses the doping level of the silicon substrate [28].”