Electrical noise and RTS fluctuations in advanced CMOS devices

By G. Ghibaudo, T. Boutchacha. Microelectronics and reliability, 2002

347 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/e071eae7c0f8ba96d50a6f81ab1f436ffc911891

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In Electrical and Electronic Engineering

1. Lode K. J. Vandamme
2. F. Hooge

Citations in the corpus

• What Do We Certainly Know About $\hbox{1}/f$ Noise in MOSTs? (2008, background): “2) The deviations from an exact 1/f dependence and spreading is smaller in larger, than in smaller, devices [62], [63].”