James A. Hutchby

Proceedings of the IEEE · 1964–2005

A researcher in the Science corpus: 4 papers; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.

Whom James A. Hutchby trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. I. Mudawar

Papers from James A. Hutchby's perspective

Ordered by how strongly the researchers James A. Hutchby trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Analytic description of short-channel effects in fully-depleted double-gate and cylindrical, surrounding-gate MOSFETs (IEEE Electron Device Letters)
  2. Assessment of high-heat-flux thermal management schemes (ITHERM 2000. The Seventh Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.00CH37069))
  3. Complementary silicide source/drain thin-body MOSFETs for the 20 nm gate length regime (International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138))
  4. A logic nanotechnology featuring strained-silicon (IEEE Electron Device Letters)
  5. RF/wireless interconnect for inter- and intra-chip communications (Proceedings of the IEEE)
  6. Extension and source/drain design for high-performance FinFET devices
  7. Extreme scaling with ultra-thin Si channel MOSFETs (Digest. International Electron Devices Meeting,)
  8. Three-dimensional conjugate heat transfer in the microchannel heat sink for electronic packaging
  9. Transport Phenomena in Two-Phase Micro-Channel Heat Sinks
  10. A uniform temperature heat sink for cooling of electronic devices

Their papers