The end of CMOS scaling: toward the introduction of new materials and structural changes to improve MOSFET performance

By Thomas Skotnicki, James A. Hutchby, Tsu-Jae King, H. Wong, Frédéric Boeuf. IEEE Circuits and Devices Magazine, 2005

418 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/11aea80418ce87f558ef469cf1dcb8bf00a51e5c