Fu-Chien Chiu
Electrical and Electronic Engineering · 2005–2014
A researcher in the Science corpus: 2 papers; trusts 4 researchers and is trusted by 7 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 9 citations into it; #3,089 of 16,539 by trust here, #10,714 by citations
Whom Fu-Chien Chiu trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts Fu-Chien Chiu overall
Papers from Fu-Chien Chiu's perspective
Ordered by how strongly the researchers Fu-Chien Chiu trusts endorse each paper. Same corpus, a different order for every researcher.
- Electrical conduction mechanisms of metal∕La2O3∕Si structure
- Direct tunneling leakage current and scalability of alternative gate dielectrics
- Resistive Random Access Memory (ReRAM) Based on Metal Oxides (Proceedings of the IEEE)
- AND T
- Γ and B
- Two Series Oxide Resistors Applicable to High Speed and High Density Nonvolatile Memory
- Low Power and High Speed Switching of Ti-doped NiO ReRAM under the Unipolar Voltage Source of less than 3 V (2007 IEEE International Electron Devices Meeting)
- Effects of heat dissipation on unipolar resistance switching in Pt∕NiO∕Pt capacitors
- Random Circuit Breaker Network Model for Unipolar Resistance Switching
- Low power and high speed bipolar switching with a thin reactive Ti buffer layer in robust HfO2 based RRAM (2008 IEEE International Electron Devices Meeting)
Their papers
- A Review on Conduction Mechanisms in Dielectric Films (2014) — 1,433 citations
- Electrical conduction mechanisms of metal∕La2O3∕Si structure (2005) — 145 citations