Lode K. J. Vandamme
IEEE Transactions on Electron Devices · 2008
A researcher in the Science corpus: 1 paper; trusts 0 researchers and is trusted by 0 researchers here, as inferred from the citation graph.
Papers from Lode K. J. Vandamme's perspective
Ordered by how strongly the researchers Lode K. J. Vandamme trusts endorse each paper. Same corpus, a different order for every researcher.
- Noise modeling for RF CMOS circuit simulation
- End of Moore's law: thermal (noise) death of integration in micro and nano electronics
- Electrical noise and RTS fluctuations in advanced CMOS devices (Microelectronics and reliability)
- Critical discussion on unified 1/f noise models for MOSFETs
- A General Theory of Phase Noise in Electrical Oscillators
- RF-CMOS Performance Trends (European Solid-State Device Research Conference)
- A compact scattering model for the nanoscale double-gate MOSFET
- Analytical modeling of quantization and volume inversion in thin Si-film DG MOSFETs
- NROM: A novel localized trapping, 2-bit nonvolatile memory cell (IEEE Electron Device Letters)
- A review of the pseudo-MOS transistor in SOI wafers: operation, parameter extraction, and applications
Their papers
- What Do We Certainly Know About $\hbox{1}/f$ Noise in MOSTs? (2008) — 182 citations