Hajime Okumura

2006

A researcher in the Science corpus: 1 paper; trusts 0 researchers and is trusted by 1 researcher here, as inferred from the citation graph.

Who trusts Hajime Okumura overall

  1. Tsunenobu Kimoto
  2. Weimin Zhang

Papers from Hajime Okumura's perspective

Ordered by how strongly the researchers Hajime Okumura trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Fundamentals of Power Semiconductor Devices
  2. Effect of nitric oxide annealing on the interface trap densities near the band edges in the 4H polytype of silicon carbide
  3. Electron mobility models for 4H, 6H, and 3C SiC [MESFETs]
  4. A Review of the State of the Art of Power Electronics for Wind Turbines (IEEE transactions on power electronics)
  5. Microgrids And Distributed Generation (Intelligent Automation and Soft Computing)
  6. Interface trap profile near the band edges at the 4H-SiC/SiO2 interface
  7. SiC versus Si—Evaluation of Potentials for Performance Improvement of Inverter and DC–DC Converter Systems by SiC Power Semiconductors (IEEE transactions on industrial electronics (1982. Print))
  8. 10 kV and 15 kV silicon carbide power MOSFETs for next-generation energy conversion and transmission systems (European Conference on Cognitive Ergonomics)
  9. Et al
  10. Power Conversion With SiC Devices at Extremely High Ambient Temperatures (IEEE transactions on power electronics)

Their papers