M. Seah

Atomic and Molecular Physics, and Optics · 2001–2013

A researcher in the Science corpus: 7 papers; trusts 3 researchers and is trusted by 4 researchers here, as inferred from the citation graph.

Subfields

• Atomic and Molecular Physics, and Optics — 9 citations into it; #3,627 of 7,135 by trust here, #4,643 by citations
• Surfaces, Coatings and Films — 8 citations into it; #574 of 752 by trust here, #579 by citations
• Radiation — 5 citations into it; #322 of 407 by trust here, #223 by citations

Whom M. Seah trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

1. Aleksander Jablonski
2. Cedric J. Powell
3. P. Cumpson
4. S. Tanuma

Who trusts M. Seah overall

1. A. Shard
2. Davide Tranchida
3. Cedric J. Powell

Papers from M. Seah's perspective

Ordered by how strongly the researchers M. Seah trusts endorse each paper. Same corpus, a different order for every researcher.

1. Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy
2. Molecular Connectivity in Structure–activity Analysis
3. ELSEPA - Dirac partial-wave calculation of elastic scattering of electrons and positrons by atoms, positive ions and molecules (Computer Physics Communications)
4. The EGS5 code system
5. Simulation and the Monte Carlo Method
6. Wrinkling of plates coupled with soft elastic media
7. Study of Elastic Modulus and Yield Strength of Polymer Thin Films Using Atomic Force Microscopy
8. Surface modification of Sylgard-184 poly(dimethyl siloxane) networks by ultraviolet and ultraviolet/ozone treatment. (Journal of Colloid and Interface Science)
9. Nanoindentation of polymers: an overview
10. Mechanical buckling instability of thin coatings deposited on soft polymer substrates

Their papers

• Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurement via AFM nanoindentation (2005) — 165 citations
• Universal equation for argon gas cluster sputtering yields. (2013) — 159 citations
• Simple universal curve for the energy‐dependent electron attenuation length for all materials (2012) — 144 citations
• The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis (2005) — 187 citations
• An accurate semi‐empirical equation for sputtering yields I: for argon ions (2005) — 134 citations
• Ultrathin SiO2 on Si II. Issues in quantification of the oxide thickness (2002) — 187 citations
• Quantitative XPS: I. Analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database (2001) — 157 citations