Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy

By D. Briggs, J. Grant. 2003

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X-ray photoelectron spectroscopy: Silver salts revisited (2012, background): “It is usually acquired that metals display asymmetric peaks and dielectric materials, symmetric ones [1], provided that a single oxidation state is present.”
Graphene Quantum Dots: Graphene-Enhanced Nanomaterials for Wall Painting Protection (Adv. Funct. Mater. 44/2018) (2018, unknown): “These values are consistent with the previously reported values(Eda et al., 2010; Hellgren et al., 2016; Matthew, 2004).”
Simulation of electron spectra for surface analysis (SESSA): a novel software tool for quantitative Auger‐electron spectroscopy and X‐ray photoelectron spectroscopy (2005, methodology): “(2) Differential inverse inelastic mean free path (a) Calculated10 using linear response theory with the algorithm developed by Penn6 and optical data11 – 13 (b) Universal curve proposed by Tougaard7 (3) Total inelastic mean free path (IMFP) (a) IMFP values for a selected set of materials calculated”
Analysis of heat-treated graphite oxide by X-ray photoelectron spectroscopy (2013, methodology): “The modified asymmetric Voigttype lineshape [74] was used to separate the waveform of XPS spectra.”