Cedric J. Powell

Surfaces, Coatings and Films · 2002–2020

A researcher in the Science corpus: 15 papers; trusts 4 researchers and is trusted by 8 researchers here, as inferred from the citation graph.

Subfields

• Surfaces, Coatings and Films — 22 citations into it; #98 of 752 by trust here, #122 by citations
• Radiation — 18 citations into it; #76 of 407 by trust here, #22 by citations
• Atomic and Molecular Physics, and Optics — 14 citations into it; #1,708 of 7,135 by trust here, #1,469 by citations

Whom Cedric J. Powell trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

1. S. Tanuma
2. Aleksander Jablonski
3. Francesc Salvat
4. David Penn
5. M. Seah

Who trusts Cedric J. Powell overall

1. G. Greczynski
2. L. Hultman
3. Aleksander Jablonski
4. M. Seah
5. S. Tanuma
6. C. Fadley
7. Francesc Salvat

Papers from Cedric J. Powell's perspective

Ordered by how strongly the researchers Cedric J. Powell trusts endorse each paper. Same corpus, a different order for every researcher.

1. Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy
2. ELSEPA - Dirac partial-wave calculation of elastic scattering of electrons and positrons by atoms, positive ions and molecules (Computer Physics Communications)
3. The EGS5 code system
4. Simulation and the Monte Carlo Method
5. QUANTUM THEORY & ATOMIC STRUCTURE
6. Boundary Lubrication of Oxide Surfaces by Poly(L-lysine)-g-poly(ethylene glycol) (PLL-g-PEG) in Aqueous Media
7. Molecular Connectivity in Structure–activity Analysis
8. MATERIALS CHARACTERIZATION IN THE ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPE
9. Plasmon spectroscopy of free-standing graphene films
10. Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy (Science)

Their papers

• Recommended Auger parameters for 42 elemental solids (2012) — 382 citations
• ELSEPA - Dirac partial-wave calculation of elastic scattering of electrons and positrons by atoms, positive ions and molecules (2005) — 589 citations
• Practical guide for inelastic mean free paths, effective attenuation lengths, mean escape depths, and information depths in x-ray photoelectron spectroscopy (2020) — 134 citations
• Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm (2015) — 332 citations
• Cross Sections for Inner-Shell Ionization by Electron Impact (2014) — 149 citations
• Surface Sensitivity of Auger-Electron Spectroscopy and X-ray Photoelectron Spectroscopy (2011) — 175 citations
• Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range (2011) — 831 citations
• Progress in quantitative surface analysis by X-ray photoelectron spectroscopy: Current status and perspectives (2010) — 211 citations
• Surface sensitivity of X-ray photoelectron spectroscopy☆ (2009) — 197 citations
• Experimental determination of electron inelastic mean free paths in 13 elemental solids in the 50 to 5000 eV energy range by elastic‐peak electron spectroscopy (2005) — 137 citations
• Calculations of electron inelastic mean free paths (2005) — 745 citations
• Simulation of electron spectra for surface analysis (SESSA): a novel software tool for quantitative Auger‐electron spectroscopy and X‐ray photoelectron spectroscopy (2005) — 242 citations
• Comparison of Electron Elastic-Scattering Cross Sections Calculated from Two Commonly Used Atomic Potentials (2004) — 191 citations
• The NIST Electron Effective-Attenuation-Length Database (2002) — 204 citations
• The electron attenuation length revisited (2002) — 200 citations