Quantitative XPS: I. Analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database

By M. Seah, I. Gilmore, S. Spencer. 2001

157 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Radiation, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/ec9ddff79701860f6f0421de1a003493fa01f1eb