Study of Elastic Modulus and Yield Strength of Polymer Thin Films Using Atomic Force Microscopy

By B. Du, O. Tsui, Qinglin Zhang, Tianbai He. 2001

156 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/0ff5615050f596f9ba6baefdec22b374d3c62917

How researchers see this paper

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In Biomedical Engineering

1. Ho-Cheol Kim
2. C. Stafford

Citations in the corpus

• A buckling-based metrology for measuring the elastic moduli of polymeric thin films (2004, methodology): “Scanning probe microscopy has been used to measure the moduli of polymer films, but uncertainty in the tip size and/or contact area often limits the accuracy of these types of measurements, and researchers are challenged to obtain more than relative value”