The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis

By C. Clifford, M. Seah. 2005

187 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/68fa3d346cd6cc6fe7a9b0034eb3e2f82fcf3557