E. Baravelli

Biomedical Engineering · 2007–2013

A researcher in the Science corpus: 2 papers; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom E. Baravelli trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Massimo Ruzzene
  2. Guoliang Huang
  3. H. H. Huang
  4. P. Frank Pai
  5. A. Spadoni
  6. Chin-teh Sun

Who trusts E. Baravelli overall

  1. A. Krushynska

Papers from E. Baravelli's perspective

Ordered by how strongly the researchers E. Baravelli trusts endorse each paper. Same corpus, a different order for every researcher.

  1. FinFET scaling to 10 nm gate length (Digest. International Electron Devices Meeting,)
  2. 25 nm CMOS Omega FETs (Digest. International Electron Devices Meeting,)
  3. The impact of intrinsic device fluctuations on CMOS SRAM cell stability (IEEE J. Solid State Circuits)
  4. Modeling line edge roughness effects in sub 100 nanometer gate length devices (International Conference on Simulation of Semiconductor Processes and Devices)
  5. Analysis of the parasitic S/D resistance in multiple-gate FETs (IEEE Transactions on Electron Devices)
  6. Tri-Gate Transistor Architecture with High-k Gate Dielectrics, Metal Gates and Strain Engineering (2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.)
  7. Sub-20 nm CMOS FinFET technologies (International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224))
  8. Wave beaming effects in two-dimensional cellular structures
  9. One-dimensional structured ultrasonic metamaterials with simultaneously negative dynamic density and modulus
  10. On modifications of Newton's second law and linear continuum elastodynamics (Proceedings of the Royal Society A)

Their papers