W. V. Spengen

Electrical and Electronic Engineering · 2003–2006

A researcher in the Science corpus: 3 papers; trusts 4 researchers and is trusted by 1 researcher here, as inferred from the citation graph.

Subfields

• Electrical and Electronic Engineering — 9 citations into it; #15,199 of 16,539 by trust here, #12,348 by citations
• Atomic and Molecular Physics, and Optics — 5 citations into it; #6,522 of 7,135 by trust here, #6,080 by citations
• Biomedical Engineering — 5 citations into it; #9,832 of 10,734 by trust here, #9,262 by citations

Whom W. V. Spengen trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

1. Roya Maboudian
2. Gabriel M. Rebeiz
3. W. Ashurst
4. Robert L. Mullen

Who trusts W. V. Spengen overall

1. Bharat Bhushan

Papers from W. V. Spengen's perspective

Ordered by how strongly the researchers W. V. Spengen trusts endorse each paper. Same corpus, a different order for every researcher.

1. Self-assembled monolayers as anti-stiction coatings for MEMS: characteristics and recent developments
2. Fracture toughness of polysilicon MEMS devices
3. Advances in telecom and datacom optical components
4. IC-Compatible Polysilicon Surface Micromachining
5. Interferometry of actuated microcantilevers to determine material properties and test structure nonidealities in MEMS
6. True Performance Metrics in Electrochemical Energy Storage (Science)
7. Ultrahigh-power micrometre-sized supercapacitors based on onion-like carbon. (Nature Nanotechnology)
8. Composition and Microstructure of 20-year-old Ordinary Portland Cement-ground Granulated Blast-furnace Slag Blends Containing 0 to 100% Slag
9. The role of Al in C-S-H: NMR, XRD, and compositional results for precipitated samples
10. Optical signature of symmetry variations and spin-valley coupling in atomically thin tungsten dichalcogenides (Scientific Reports)

Their papers

• A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches (2004) — 260 citations
• A physical model to predict stiction in MEMS (2006) — 194 citations
• MEMS reliability from a failure mechanisms perspective (2003) — 309 citations