A physical model to predict stiction in MEMS
By W. V. Spengen, Robert Puers, I. D. Wolf. 2006
194 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/e426dccf5a7634494cd0921bc8b579feed385ace
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In Atomic and Molecular Physics, and Optics
In Electrical and Electronic Engineering
Citations in the corpus
- Review of modeling electrostatically actuated microelectromechanical systems (2007, background): “Stiction in MEMSs due to van der Waals forces has been studied in [118], and in [119], the effect on the pull-in parameters of cantilever NEM switches is investigated.”
- Trapping, corralling and spectral bonding of optical resonances through optically induced potentials (2007, background): “Short-range interactions such as van der Waals and capillary forces need not significantly affect the operation of such devices if the distance q between interacting surfaces is kept greater than approximately 20 to 30 nm (corresponding to the retarded regime of van der Waals interaction”