Interferometry of actuated microcantilevers to determine material properties and test structure nonidealities in MEMS
By B. Jensen, M. P. D. Boer, Nathan D. Masters, F. Bitsie, D. Laván. 2001
134 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/e412a88eb400501b2bc42b8ebd2e0c577b720d59
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In Atomic and Molecular Physics, and Optics
In Electrical and Electronic Engineering
Citations in the corpus
- High-performance surface-micromachined inchworm actuator (2003, methodology): “Assuming Young’s Modulus for polysilicon [ 13 ] and a yield strength (from nanoindentation modeling of experimental data [29]), we plot the estimated contact parameters in Fig. 16. For parallel surfaces, the apparent contact pressure is the normal load divided by the nominal contact area.”