Claudio Fiegna
Electrical and Electronic Engineering · 2008
A researcher in the Science corpus: 1 paper; trusts 2 researchers and is trusted by 0 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 8 citations into it
Whom Claudio Fiegna trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Papers from Claudio Fiegna's perspective
Ordered by how strongly the researchers Claudio Fiegna trusts endorse each paper. Same corpus, a different order for every researcher.
- Essential physics of carrier transport in nanoscale MOSFETs (International Conference on Simulation of Semiconductor Processes and Devices)
- A logic nanotechnology featuring strained-silicon (IEEE Electron Device Letters)
- Nanoscale thermal transport (Journal of Applied Physics)
- Understanding quasi-ballistic transport in nano-MOSFETs: part I-scattering in the channel and in the drain (IEEE Transactions on Electron Devices)
- Thermal Conductivity Measurements of Ultra-Thin Single Crystal Silicon Layers
- Measurement of thermal conductivity of silicon dioxide thin films using a 3ω method
- Impact of self-heating effect on long-term reliability and performance degradation in CMOS circuits (IEEE transactions on device and materials reliability)
- Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETs
- Silicon CMOS devices beyond scaling (IBM Journal of Research and Development)
- Low field electron and hole mobility of SOI transistors fabricated on ultrathin silicon films for deep submicrometer technology application
Their papers
- Analysis of Self-Heating Effects in Ultrathin-Body SOI MOSFETs by Device Simulation (2008) — 137 citations