Measurement of thermal conductivity of silicon dioxide thin films using a 3ω method

By T. Yamane, N. Nagai, S. Katayama, M. Todoki. 2002

352 citations recorded by the source corpus.

Subfields: Civil and Structural Engineering, Materials Chemistry, Mechanical Engineering

View Paper: https://www.semanticscholar.org/paper/aed5f953573376bf17e20cdf3cf4d06f91543328

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Civil and Structural Engineering

1. Eric Pop

In Materials Chemistry

1. Eric Pop
2. Yang Yang
3. A. O'Neill
4. Claudio Fiegna
5. Enrico Sangiorgi
6. M. Wingert
7. Renkun Chen
8. Jianlin Zheng

In Mechanical Engineering

1. Eric Pop

Citations in the corpus

• Analysis of Self-Heating Effects in Ultrathin-Body SOI MOSFETs by Device Simulation (2008, background): “An additional surface thermal resistance of 2×10−4K·cm2/W is added to the gate contact in order to account for surface effects at both the silicon-dielectric and dielectric-gate interfaces [53], [54].”
• Thermal transport in amorphous materials: a review (2016, methodology): “15 Silica Yamane et al [124] Thermal 3ω 48–1000 1.”
• Energy dissipation and transport in nanoscale devices (2010, methodology): “Thermal interfaces are most often studied with pump-probe optical techniques such as time-domain thermoreflectance (TDTR), picosecond transient absorption [147–152], or the 3-omega method [153–157].”