Impact of self-heating effect on long-term reliability and performance degradation in CMOS circuits

By O. Semenov, A. Vassighi, M. Sachdev. IEEE transactions on device and materials reliability, 2006

166 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/c9d916728fbfa41e570ee1700c9fb43bb0612d23

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In Electrical and Electronic Engineering

1. Yang Yang
2. A. O'Neill
3. Claudio Fiegna
4. Enrico Sangiorgi

Citations in the corpus

• Analysis of Self-Heating Effects in Ultrathin-Body SOI MOSFETs by Device Simulation (2008, methodology): “The impact of self-heating (SHE) in the SOI MOSFETs has been the subject of investigation in the past by both experiments [17]–[20]: 1-D thermal models [21], [22] and 2-D device simulation [23]–[25].”