G. Greczynski

Electrical and Electronic Engineering · 2001–2024

A researcher in the Science corpus: 14 papers; trusts 8 researchers and is trusted by 1 researcher here, as inferred from the citation graph.

Subfields

• Electrical and Electronic Engineering — 32 citations into it; #9,642 of 16,539 by trust here, #3,412 by citations
• Materials Chemistry — 26 citations into it; #7,326 of 11,513 by trust here, #8,835 by citations
• Mechanics of Materials — 21 citations into it; #5,597 of 6,291 by trust here, #3,454 by citations
• Surfaces, Coatings and Films — 21 citations into it; #320 of 752 by trust here, #411 by citations
• Radiation — 15 citations into it; #327 of 407 by trust here, #191 by citations
• Atomic and Molecular Physics, and Optics — 12 citations into it
• Polymers and Plastics — 10 citations into it
• Electrochemistry — 6 citations into it

Whom G. Greczynski trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

1. L. Hultman
2. Cedric J. Powell
3. S. Tanuma
4. A. Shard
5. I. Bertóti
6. Saulius Kaciulis
7. David Penn
8. P. Mayrhofer
9. I. Petrov

Who trusts G. Greczynski overall

1. L. Hultman
2. A. Anders
3. J. Greene

Papers from G. Greczynski's perspective

Ordered by how strongly the researchers G. Greczynski trusts endorse each paper. Same corpus, a different order for every researcher.

1. I and i
2. Spectroscopy of carbon: from diamond to nitride films
3. Calculations of electron inelastic mean free paths
4. Metal‐Semiconductor Contacts
5. Detection limits in XPS for more than 6000 binary systems using Al and Mg Kα X‐rays
6. Recommended Auger parameters for 42 elemental solids
7. Characterization of nitride coatings by XPS
8. Surface characterization of transparent conductive oxide Al-doped ZnO films
9. Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy
10. Two‐Dimensional Nanocrystals Produced by Exfoliation of Ti3AlC2 (Advances in Materials)

Their papers

• The effects of solvents on the morphology and sheet resistance in poly(3,4-ethylenedioxythiophene)–polystyrenesulfonic acid (PEDOT–PSS) films (2003) — 676 citations
• Photoelectron spectroscopy of thin films of PEDOT-PSS conjugated polymer blend: A mini-review and some new results (2001) — 369 citations
• Reliable determination of chemical state in x-ray photoelectron spectroscopy based on sample-work-function referencing to adventitious carbon: Resolving the myth of apparent constant binding energy of the C 1s peak (2018) — 1,322 citations
• Core-level spectra and binding energies of transition metal nitrides by non-destructive x-ray photoelectron spectroscopy through capping layers (2017) — 161 citations
• Self-consistent modelling of X-ray photoelectron spectra from air-exposed polycrystalline TiN thin films (2016) — 259 citations
• X-ray photoelectron spectroscopy: Towards reliable binding energy referencing (2020) — 2,199 citations
• Binding energy referencing in X-ray photoelectron spectroscopy: Expanded data set confirms that adventitious carbon aligns to the sample vacuum level (2024) — 233 citations
• Towards reliable X-ray photoelectron spectroscopy: Sputter-damage effects in transition metal borides, carbides, nitrides, and oxides (2021) — 201 citations
• The same chemical state of carbon gives rise to two peaks in X-ray photoelectron spectroscopy (2021) — 610 citations
• XPS guide: Charge neutralization and binding energy referencing for insulating samples (2020) — 232 citations
• Compromising science by ignorant instrument calibration - need to revisit half a century of published XPS data. (2020) — 801 citations
• C 1s Peak of Adventitious Carbon Aligns to the Vacuum Level: Dire Consequences for Material's Bonding Assignment by Photoelectron Spectroscopy (2017) — 970 citations
• A review of metal-ion-flux-controlled growth of metastable TiAlN by HIPIMS/DCMS co-sputtering (2014) — 150 citations
• Role of Tin+ and Aln+ ion irradiation (n = 1, 2) during Ti1-xAlxN alloy film growth in a hybrid HIPIMS/magnetron mode (2012) — 133 citations