Self-consistent modelling of X-ray photoelectron spectra from air-exposed polycrystalline TiN thin films

By G. Greczynski, L. Hultman. 2016

259 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Mechanics of Materials, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/febbf18f1079ad5eb17f5cc7d3093b842ce4621b

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. G. Greczynski
2. L. Hultman

In Mechanics of Materials

1. G. Greczynski
2. L. Hultman
3. A. Anders

In Surfaces, Coatings and Films

1. G. Greczynski
2. L. Hultman

Citations in the corpus

• X-ray photoelectron spectroscopy: Towards reliable binding energy referencing (2020, background): “Secondly, quantitative self-consistency requires that the elemental concentrations extracted based upon the A1 and B1 peak areas (assuming sample homogeneity within the probed volume) correspond to the compound stoichiometry m/n [13].”