Energy dissipation in submicrometer thick single-crystal silicon cantilevers
By Jinling Yang, Takahito Ono, Masayoshi Esashi. 2002
327 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/dcc1716399df2e3576c39dde8a0007ed00468c0e
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Atomic and Molecular Physics, and Optics
- Thomas W. Kenny
- Saurabh A. Chandorkar
- Matt Hopcroft
- Bongsang Kim
- Woo-Tae Park
- Rob N. Candler
- Meiyong Liao
- Eldwin Jiaqiang Ng
In Electrical and Electronic Engineering
- Thomas W. Kenny
- Saurabh A. Chandorkar
- Matt Hopcroft
- Woo-Tae Park
- Bongsang Kim
- Rob N. Candler
- Mathew Varghese
- Gary Yama
Citations in the corpus
- Progress in semiconductor diamond photodetectors and MEMS sensors (2021, background): “A key point is that the Q factor of the SCD cantilever fabricated by the smart-cut method is limited by the bulk defects or surface effect dissipation induced by ion implantation [122,123].”
- An analytical model for support loss in micromachined beam resonators with in-plane flexural vibrations (2003, unknown): “F) and clamped–clamped (C–”
- Impact of geometry on thermoelastic dissipation in micromechanical resonant beams (2006, background): “Clamping loss in micromechanical resonators is an area that has been receiving an increasing amount of attention [14]–[18], but it is still not fully understood.”
- Temperature Dependence of Quality Factor in MEMS Resonators (2006, unknown): “Surface loss is another known energy loss mechanism in microscale resonators [25], [26], [29]–[31].”