Quality factors in micron- and submicron-thick cantilevers

By K. Yasumura, T. Stowe, Eugene M. Chow, Timothy Pfafman, Thomas W. Kenny, Barry C. Stipe, Daniel Rugar. Journal of microelectromechanical systems, 2000

710 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/7ef2f11a7c842a5f1df7a8e911393f66eb6a946d

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

  1. Thomas W. Kenny
  2. S. Vengallatore
  3. S. Prabhakar
  4. M. Imboden
  5. P. Mohanty
  6. Harold S. Park
  7. Patrick A. Klein
  8. Eyal Buks

In Electrical and Electronic Engineering

  1. Thomas W. Kenny
  2. S. Vengallatore
  3. S. Prabhakar
  4. M. Imboden
  5. P. Mohanty
  6. Saurabh A. Chandorkar
  7. Matt Hopcroft
  8. Harold S. Park

Citations in the corpus