Johan Böhlmark
Mechanics of Materials · 2005–2006
A researcher in the Science corpus: 4 papers; trusts 1 researcher and is trusted by 4 researchers here, as inferred from the citation graph.
Subfields
- Mechanics of Materials — 29 citations into it; #2,618 of 6,291 by trust here, #1,205 by citations
- Electrical and Electronic Engineering — 22 citations into it; #7,978 of 16,539 by trust here, #6,291 by citations
Whom Johan Böhlmark trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts Johan Böhlmark overall
Papers from Johan Böhlmark's perspective
Ordered by how strongly the researchers Johan Böhlmark trusts endorse each paper. Same corpus, a different order for every researcher.
- AND T
- A and V
- Γ and B
- I and i
- Metal‐Semiconductor Contacts
- Detection limits in XPS for more than 6000 binary systems using Al and Mg Kα X‐rays
- Advantages of using self-lubricating, hard, wear-resistant mos2-based coatings
- Top-gated graphene field-effect-transistors formed by decomposition of SiC
- Solid–liquid reaction synthesis and simultaneous densification of polycrystalline Ti2AlC
- Two‐Dimensional Nanocrystals Produced by Exfoliation of Ti3AlC2 (Advances in Materials)
Their papers
- Ion-assisted physical vapor deposition for enhanced film properties on nonflat surfaces (2005) — 236 citations
- Ionized physical vapor deposition (IPVD): A review of technology and applications (2006) — 1,011 citations
- Investigation of high power impulse magnetron sputtering pretreated interfaces for adhesion enhancement of hard coatings on steel (2006) — 155 citations
- The ion energy distributions and ion flux composition from a high power impulse magnetron sputtering discharge (2006) — 311 citations