MATERIALS CHARACTERIZATION IN THE ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPE

By M. Varela, A. Lupini, K. Benthem, A. Borisevich, M. Chisholm, N. Shibata, E. Abe, S. Pennycook. 2005

198 citations recorded by the source corpus.

Subfields: Materials Chemistry, Structural Biology, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/0108009f0234d947fdec1a9fac91a38e63f039ca

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Materials Chemistry

1. Shyue Ping Ong
2. Chi Chen
3. Anubhav Jain
4. Alok N. Choudhary
5. Chris Wolverton
6. V. Patel
7. Simon J. L. Billinge
8. Guofeng Zhang

In Structural Biology

1. R. Egerton

In Surfaces, Coatings and Films

1. R. Egerton

Citations in the corpus

• Electron energy-loss spectroscopy in the TEM (2008, methodology): “With the aid of electron-channelling calculations, it may even be possible to use the core-loss intensity to estimate the depth of each atom, thereby providing three-dimensional atomic imaging (Varela et al 2005).”
• Recent advances and applications of deep learning methods in materials science (2021, background): “Over the past few decades, atomic-scale imaging has become widespread and near-routine due to aberration-corrected STEM 209 .”
• Targeted killing of cancer cells in vivo and in vitro with EGF-directed carbon nanotube-based drug delivery. (2009, methodology): “EDX analysis for Pt was done using a VG HB501 dedicated scanning transmission electron microscope operating at 100 kV and equipped with an Oxford energy-dispersive X-ray microanalysis system.(56) (Full details in Supporting Information file.”