Simulation of electron spectra for surface analysis (SESSA): a novel software tool for quantitative Auger‐electron spectroscopy and X‐ray photoelectron spectroscopy

By W. Smekal, W. Werner, Cedric J. Powell. 2005

242 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Radiation, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/eba02cf8fe5d96e8a4e37957f27c3c5af9446c52