Progress in quantitative surface analysis by X-ray photoelectron spectroscopy: Current status and perspectives

By Cedric J. Powell, Aleksander Jablonski. 2010

211 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Radiation, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/70d675845184ec4ffb1ba40a348497b2f4975e14