K. Nickel

Electrical and Electronic Engineering · 2000–2008

A researcher in the Science corpus: 3 papers; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom K. Nickel trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. E. Opila

Papers from K. Nickel's perspective

Ordered by how strongly the researchers K. Nickel trusts endorse each paper. Same corpus, a different order for every researcher.

  1. The IAPWS Formulation 1995 for the Thermodynamic Properties of Ordinary Water Substance for General and Scientific Use
  2. Silicon carbide and diamond for high temperature device applications
  3. Effect of nitric oxide annealing on the interface trap densities near the band edges in the 4H polytype of silicon carbide
  4. Structure of recombination-induced stacking faults in high-voltage SiC p–n junctions
  5. Reduction of interface-state density in 4H–SiC n-type metal–oxide–semiconductor structures using high-temperature hydrogen annealing
  6. Observation of 4H–SiC to 3C–SiC polytypic transformation during oxidation
  7. Viscosity of silica
  8. Effects of nitridation in gate oxides grown on 4H-SiC
  9. High-carbon concentrations at the silicon dioxide–silicon carbide interface identified by electron energy loss spectroscopy
  10. The surface chemistry of amorphous silica. Zhuravlev model

Their papers