Memory Errors in Modern Systems: The Good, The Bad, and The Ugly

By Vilas Sridharan, Nathan Debardeleben, Sean Blanchard, Kurt B. Ferreira, Jon Stearley, John M. Shalf, S. Gurumurthi. International Conference on Architectural Support for Programming Languages and Operating Systems, 2015

326 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality

View Paper: https://www.semanticscholar.org/paper/f6475cf0fd3c15c836420264ae87c1b00c064526

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Onur Mutlu
2. Jeremie S. Kim
3. Saugata Ghose
4. Yixin Luo
5. Yu Cai
6. Erich F. Haratsch
7. Yoongu Kim

Citations in the corpus

• Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives (2017, background): “Akin to the large-scale flash memory SSD reliability studies discussed in Section 4.6, a number of experimental studies characterize the reliability of DRAM at large scale in the field (e.g., [70, 123, 163, 169, 170]).”
• RowHammer: A Retrospective (2019, background): “There have been recent large-scale field studies of memory errors showing that both DRAM and NAND flash memory technologies are becoming less reliable [42], [50], [52], [53], [165], [166], [169], [170], [173], [174], [181], [194], [212], [225]–[227].”