An Electronic Synapse Device Based on Metal Oxide Resistive Switching Memory for Neuromorphic Computation
By Shimeng Yu, Yi Wu, Rakesh Gnana David Jeyasingh, Duygu Kuzum, H. Philip Wong. IEEE Transactions on Electron Devices, 2011
697 citations recorded by the source corpus.
Subfields: Cellular and Molecular Neuroscience, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/ca02124b2e5d23b549f8889f8ea736f07627595e
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Cellular and Molecular Neuroscience
- Daniele Ielmini
- H. Philip Wong
- Shimeng Yu
- Ximeng Guan
- J. Joshua Yang
- Shih-Chii Liu
- Giacomo Indiveri
- Qiangfei Xia
In Electrical and Electronic Engineering
- Shimeng Yu
- Daniele Ielmini
- H. Philip Wong
- Ximeng Guan
- J. Joshua Yang
- Giacomo Indiveri
- Qiangfei Xia
- Duygu Kuzum
Citations in the corpus
- Spin-transfer torque magnetic memory as a stochastic memristive synapse (2014, neutral): “devices to implement STDP [9], [11]–[14], [44], [53]–[57],”
- Memristor crossbar arrays with 6-nm half-pitch and 2-nm critical dimension (2018, background): “n electrode. It involves the repeated deposition of metal thin film, contact and isolation layer on the sidewall of a silicon oxide trench (1-4), planarization and polishing to expose the metal edges (5) and bonding of two nanofin chips with switching layer sandwiched in between (6). A step-by-step ”
- Artificial synapse network on inorganic proton conductor for neuromorphic systems (2013, background): “[5] Recently, resistive switching memory, memristors or atomic switch have been investigated in biologically inspired neuromorphic circuits.[6-11] Important synaptic learning rules such as spike-timing dependent plasticity (STDP) and short-term memory to long-term memory transition have been demonst”
- On the Switching Parameter Variation of Metal Oxide RRAM—Part II: Model Corroboration and Device Design Strategy (2012, result): “part II of the paper (the current paper), we corroborate the simulation results with the experimental data of HfOx-based RRAM devices [15], [16], such as the dc I–V switching characteristics”