Electronic band structure of wurtzite GaN under biaxial strain in the M plane investigated with photoreflectance spectroscopy
By Sandip Ghosh, P. Waltereit, O. Brandt, Holger Grahn, K. Ploog. 2002
220 citations recorded by the source corpus.
Subfields: Biomedical Engineering, Condensed Matter Physics, Mechanics of Materials
View Paper: https://www.semanticscholar.org/paper/0884efcb966b3342c2ccdfa9709dd07ba29cc91b
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In Biomedical Engineering
In Condensed Matter Physics
In Mechanics of Materials
Citations in the corpus
- Nonpolar and Semipolar III-Nitride Light-Emitting Diodes: Achievements and Challenges (2010, background): “m-oriented GaN was not grown on sapphire because of intolerable lattice mismatch; better options were m-plane SiC [20], [21] and (100) γ-LiAlO2 [24], [48], [49].”
- X-ray diffraction of III-nitrides (2009, background): “In the absence of elastic constants, reciprocal space mapping of planes parallel to each of the major in-plane directions can be performed, giving a relative measure of inplane relaxation relative to that of the substrate and a rough measure of alloy composition [232].”